A Compression Improvement Technique for Low-Power Scan Test Data
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Song, Jaehoon | - |
dc.contributor.author | Yi, Hyunbean | - |
dc.contributor.author | Hwang, Doochan | - |
dc.contributor.author | Park, Sungju | - |
dc.date.accessioned | 2021-06-23T21:04:09Z | - |
dc.date.available | 2021-06-23T21:04:09Z | - |
dc.date.created | 2021-02-18 | - |
dc.date.issued | 2006-11 | - |
dc.identifier.issn | 2159-3442 | - |
dc.identifier.uri | https://scholarworks.bwise.kr/erica/handle/2021.sw.erica/44524 | - |
dc.description.abstract | The huge test data volume, test time and power consumption are major problems in system-on-a-chip testing. To tackle those problems, we propose a new test data compression technique. Initially, don't-cares in a pre-computed test cube set are assigned to reduce the test power consumption, and then, the fully specified low-power test data is transformed to improve compression efficiency by neighboring bitwise exclusive-or (NB-XOR) scheme. Finally, the transformed test set is compressed to reduce both the test equipment storage requirements and test application time | - |
dc.language | 영어 | - |
dc.language.iso | en | - |
dc.publisher | IEEE | - |
dc.title | A Compression Improvement Technique for Low-Power Scan Test Data | - |
dc.type | Article | - |
dc.contributor.affiliatedAuthor | Park, Sungju | - |
dc.identifier.doi | 10.1109/TENCON.2006.344040 | - |
dc.identifier.scopusid | 2-s2.0-34547605994 | - |
dc.identifier.bibliographicCitation | IEEE TENCON 2006 HONGKONG | - |
dc.relation.isPartOf | IEEE TENCON 2006 HONGKONG | - |
dc.citation.title | IEEE TENCON 2006 HONGKONG | - |
dc.type.rims | ART | - |
dc.description.journalClass | 3 | - |
dc.description.isOpenAccess | N | - |
dc.description.journalRegisteredClass | other | - |
dc.identifier.url | https://ieeexplore.ieee.org/document/4142590/ | - |
Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.
55 Hanyangdeahak-ro, Sangnok-gu, Ansan, Gyeonggi-do, 15588, Korea+82-31-400-4269 sweetbrain@hanyang.ac.kr
COPYRIGHT © 2021 HANYANG UNIVERSITY. ALL RIGHTS RESERVED.
Certain data included herein are derived from the © Web of Science of Clarivate Analytics. All rights reserved.
You may not copy or re-distribute this material in whole or in part without the prior written consent of Clarivate Analytics.