A Compression Improvement Technique for Low-Power Scan Test Data
- Authors
- Song, Jaehoon; Yi, Hyunbean; Hwang, Doochan; Park, Sungju
- Issue Date
- Nov-2006
- Publisher
- IEEE
- Citation
- IEEE TENCON 2006 HONGKONG
- Indexed
- OTHER
- Journal Title
- IEEE TENCON 2006 HONGKONG
- URI
- https://scholarworks.bwise.kr/erica/handle/2021.sw.erica/44524
- DOI
- 10.1109/TENCON.2006.344040
- ISSN
- 2159-3442
- Abstract
- The huge test data volume, test time and power consumption are major problems in system-on-a-chip testing. To tackle those problems, we propose a new test data compression technique. Initially, don't-cares in a pre-computed test cube set are assigned to reduce the test power consumption, and then, the fully specified low-power test data is transformed to improve compression efficiency by neighboring bitwise exclusive-or (NB-XOR) scheme. Finally, the transformed test set is compressed to reduce both the test equipment storage requirements and test application time
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