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고속/고밀도 VLSI 회로의 공진현상을 감소시키기 위한 효율적인 파워/그라운드 네트워크 설계

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dc.contributor.author류순걸-
dc.contributor.author어영선-
dc.contributor.author심종-
dc.date.accessioned2021-06-23T21:38:19Z-
dc.date.available2021-06-23T21:38:19Z-
dc.date.issued2006-07-
dc.identifier.issn1229-6368-
dc.identifier.urihttps://scholarworks.bwise.kr/erica/handle/2021.sw.erica/44764-
dc.description.abstract본 논문에서는 온칩 디커플링 커패시터에 의한 파워/그라운드 라인에서의 RLC 공진현상을 감소시키기 위한 해석적인 모델을 제시한다. 패키지 인덕턴스와 온칩 디커플링 커패시터 및 출력 드라이버로 인하여 형성되는 RLC 공진 회로의 공진주파수를 정확하게 예측하였다. 예측된 공진주파수를 이용하여 회로 동작에 필요한 적절한 디커플링 커패시터의 크기를 결정할 수 있다. 본 논문에서 제시한 공진현상을 감소시킬 수 있는 새로운 설계 방법의 타당성은 0.18㎛ 공정 HSPICE 모델을 사용한 시뮬레이션을 통하여 검증하였다.-
dc.description.abstractThis paper presents a new analytical model to suppress RLC resonance effects which inevitably occur in power/ground lines due to on-chip decoupling capacitor and other interconnect circuit parasitics (i.e., package inductance, on-chip decoupling capacitor, and output drivers, etc.). To characterize the resonance effects, the resonance frequency of the circuit is accurately estimated in an analytical manner. Thereby, a decoupling capacitor size to suppress the resonance for a suitable circuit operation is accurately determined by using the estimated resonance frequency. The developed novel design methodology is verified by using 0.18㎛ process-based-HSPICE simulation.-
dc.format.extent9-
dc.language한국어-
dc.language.isoKOR-
dc.publisher대한전자공학회-
dc.title고속/고밀도 VLSI 회로의 공진현상을 감소시키기 위한 효율적인 파워/그라운드 네트워크 설계-
dc.title.alternativeEffective Power/Ground Network Design Techniques to suppress Resonance Effects in High-Speed/High-Density VLSI Circuits-
dc.typeArticle-
dc.publisher.location대한민국-
dc.identifier.bibliographicCitation전자공학회논문지, v.43, no.7, pp 29 - 37-
dc.citation.title전자공학회논문지-
dc.citation.volume43-
dc.citation.number7-
dc.citation.startPage29-
dc.citation.endPage37-
dc.identifier.kciidART001045342-
dc.description.isOpenAccessN-
dc.description.journalRegisteredClasskci-
dc.subject.keywordAuthorresonance-
dc.subject.keywordAuthorground bounce-
dc.subject.keywordAuthoron-chip decoupling capacitor-
dc.subject.keywordAuthorsignal integrity-
dc.identifier.urlhttps://www.dbpia.co.kr/journal/articleDetail?nodeId=NODE00727395-
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