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Dielectric properties of < 001 >-oriented Ba0.6Sr0.4TiO3 thin films on polycrystalline metal tapes using biaxially oriented MgO/gamma-Al2O3 buffer layers
- Authors
- Choi, W; Kang, BS; Jia, QX; Matias, V; Findikoglu, AT
- Issue Date
- Feb-2006
- Publisher
- AMER INST PHYSICS
- Keywords
- BARIUM STRONTIUM-TITANATE; COATED CONDUCTORS; MGO; TEMPLATES
- Citation
- APPLIED PHYSICS LETTERS, v.88, no.6, pp.1 - 4
- Indexed
- SCIE
SCOPUS
- Journal Title
- APPLIED PHYSICS LETTERS
- Volume
- 88
- Number
- 6
- Start Page
- 1
- End Page
- 4
- ISSN
- 0003-6951
- Abstract
- We report the growth of < 001 >-oriented Ba0.6Sr0.4TiO3 (BST) thin films on polycrystalline Ni-alloy tapes by pulsed laser deposition using biaxially oriented, ion-beam-assisted deposited (IBAD) MgO and gamma-Al2O3 buffer layers. Dielectric constant values of our BST films were up to similar to 85% of those in the epitaxial films prepared under similar conditions on single-crystal MgO substrates. No significant dispersion of the dielectric constant was observed for frequencies from 100 Hz to 1 MHz. These results demonstrate the versatility of using IBAD-textured MgO and gamma-Al2O3 buffer layers to integrate highly oriented good-quality BST films with nonsingle-crystalline substrates.
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Related Researcher
- Kang, Bo Soo
- COLLEGE OF SCIENCE AND CONVERGENCE TECHNOLOGY (DEPARTMENT OF APPLIED PHYSICS)