Rubbed polyimide layers studied by rotating sample and compensator spectroscopic ellipsometry
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Kyoung, Jaesun | - |
dc.contributor.author | Bang, Kyungyoon | - |
dc.contributor.author | Oh, Hyekeun. | - |
dc.contributor.author | Lee, Iksoo | - |
dc.contributor.author | Kim, Hochul | - |
dc.contributor.author | Jeon, Dong Ryul | - |
dc.contributor.author | An, Ilsin | - |
dc.date.accessioned | 2021-06-23T23:03:41Z | - |
dc.date.available | 2021-06-23T23:03:41Z | - |
dc.date.issued | 2005-10 | - |
dc.identifier.issn | 0021-4922 | - |
dc.identifier.issn | 1347-4065 | - |
dc.identifier.uri | https://scholarworks.bwise.kr/erica/handle/2021.sw.erica/45710 | - |
dc.description.abstract | Rotating compensator spectroscopic ellipsometry was used to study the optical properties of a rubbed polyimide layer. Two operating modes in the transmission configuration were studied. One was a conventional mode of 'polarizer-sample-rotating compensator-analyzer'. The other was a dual rotation mode of 'polarizer-rotating sample-rotating compensator-analyzer'. We found that calibration is not possible in the conventional mode due to the extremely small retardance and non-dichroic nature of the sample. Meanwhile, in dual rotation mode which we developed, a retardance smaller than 0.5 degrees could be measured without calibration. Using this technique, the variation in retardance with rubbing could be easily determined over a range of 320-800 nm. The optical axis could also be determined with high precision for this sample, and this optical axis was found to be parallel to the direction of rubbing. | - |
dc.format.extent | 4 | - |
dc.language | 영어 | - |
dc.language.iso | ENG | - |
dc.publisher | IOP Publishing Ltd | - |
dc.title | Rubbed polyimide layers studied by rotating sample and compensator spectroscopic ellipsometry | - |
dc.type | Article | - |
dc.publisher.location | 영국 | - |
dc.identifier.doi | 10.1143/JJAP.44.7667 | - |
dc.identifier.scopusid | 2-s2.0-31544460684 | - |
dc.identifier.wosid | 000232739300095 | - |
dc.identifier.bibliographicCitation | Japanese Journal of Applied Physics, v.44, no.10, pp 7667 - 7670 | - |
dc.citation.title | Japanese Journal of Applied Physics | - |
dc.citation.volume | 44 | - |
dc.citation.number | 10 | - |
dc.citation.startPage | 7667 | - |
dc.citation.endPage | 7670 | - |
dc.type.docType | Article | - |
dc.description.isOpenAccess | N | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.relation.journalResearchArea | Physics | - |
dc.relation.journalWebOfScienceCategory | Physics, Applied | - |
dc.subject.keywordPlus | LIQUID-CRYSTAL | - |
dc.subject.keywordPlus | MOLECULAR-ORIENTATION | - |
dc.subject.keywordPlus | ALIGNMENT | - |
dc.subject.keywordPlus | FILMS | - |
dc.subject.keywordAuthor | spectroscopy | - |
dc.subject.keywordAuthor | compensator | - |
dc.subject.keywordAuthor | ellipsometry | - |
dc.subject.keywordAuthor | retardance | - |
dc.subject.keywordAuthor | rubbing | - |
dc.subject.keywordAuthor | polyimide | - |
dc.identifier.url | https://iopscience.iop.org/article/10.1143/JJAP.44.7667 | - |
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