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Self-assembled GaN nano-rods grown directly on (111) Si substrates: Dependence on growth conditions

Authors
Park, YSLee, Seung HoOh, Jae EungPark, Chang moKang, Tae won
Issue Date
Sep-2005
Publisher
ELSEVIER SCIENCE BV
Keywords
growth models; molecular beam epitaxy; nitrides
Citation
JOURNAL OF CRYSTAL GROWTH, v.282, no.3-4, pp 313 - 319
Pages
7
Indexed
SCIE
SCOPUS
Journal Title
JOURNAL OF CRYSTAL GROWTH
Volume
282
Number
3-4
Start Page
313
End Page
319
URI
https://scholarworks.bwise.kr/erica/handle/2021.sw.erica/45735
DOI
10.1016/j.jcrysgro.2005.05.058
ISSN
0022-0248
1873-5002
Abstract
We have investigated the growth condition, i.e. growth time and V/III ratio determining Ga-rich and N-rich conditions, influence on the formation of dislocation-free vertical GaN nano-rods grown on (1 1 1) Si substrate by molecular beam epitaxy. The hexagonal shape nano-rod with diameters ranging from < 10 to 350 nm is fully relaxed from lattice strain, having a very good crystal quality characterized by dislocation-free lattice images observed by transmission electron microscopy (TEM) and extremely strong photoluminescence excitonic lines near 3.47eV. The nano-rod starts to protrude after the formation of an approximately 0.4-mu m thick columnar film base, and its density and physical dimension, i.e. diameter and height, are strongly dependent on V/III ratio and growth time. We have found that the hexagonal nano-rod can be formed on Si substrate, not only in N-rich condition but also even in a Ga-rich condition, when it is formed without buffer layer at high growth temperatures. (c) 2005 Elsevier B.V. All rights reserved.
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