Effects of patterns on corrosion in Cu CMP
DC Field | Value | Language |
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dc.contributor.author | Han, Ja hyung | - |
dc.contributor.author | Koo, Ja eung | - |
dc.contributor.author | Hong, Duk ho | - |
dc.contributor.author | Park, Byung lyul | - |
dc.contributor.author | Kim, Seong il | - |
dc.contributor.author | Cho, In soo | - |
dc.contributor.author | Eom, Dae hong | - |
dc.contributor.author | Park, Jin Goo | - |
dc.contributor.author | Busnaina, A.Samsung Electronics Co. | - |
dc.date.accessioned | 2021-06-24T00:07:17Z | - |
dc.date.available | 2021-06-24T00:07:17Z | - |
dc.date.issued | 2005-00 | - |
dc.identifier.issn | 1012-0394 | - |
dc.identifier.issn | 1662-9779 | - |
dc.identifier.uri | https://scholarworks.bwise.kr/erica/handle/2021.sw.erica/46428 | - |
dc.description.abstract | Corrosion on specific Cu patterns was evaluated during Cu CMP. The corrosion was observed at isolated patterns and outer edge area of pad surrounded by oxide field after polishing and showed dependency on process. Two different commercial slurries were chosen and used for polishing after characterizing electrochemical and frictional properties. Stress simulations were conducted on these patterns. Higher stress was calculated on these patterns. The process temperature and friction behavior of Cu affected the magnitude of corrosion on Cu on these patterns. | - |
dc.format.extent | 4 | - |
dc.language | 영어 | - |
dc.language.iso | ENG | - |
dc.publisher | Scitec Publications Ltd. | - |
dc.title | Effects of patterns on corrosion in Cu CMP | - |
dc.type | Article | - |
dc.publisher.location | 스위스 | - |
dc.identifier.doi | 10.4028/www.scientific.net/SSP.103-104.369 | - |
dc.identifier.scopusid | 2-s2.0-85087534676 | - |
dc.identifier.wosid | 000230349000082 | - |
dc.identifier.bibliographicCitation | Solid State Phenomena, v.103-104, pp 369 - 372 | - |
dc.citation.title | Solid State Phenomena | - |
dc.citation.volume | 103-104 | - |
dc.citation.startPage | 369 | - |
dc.citation.endPage | 372 | - |
dc.type.docType | Conference Paper | - |
dc.description.isOpenAccess | N | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.relation.journalResearchArea | Materials Science | - |
dc.relation.journalResearchArea | Physics | - |
dc.relation.journalWebOfScienceCategory | Materials Science, Multidisciplinary | - |
dc.relation.journalWebOfScienceCategory | Physics, Applied | - |
dc.relation.journalWebOfScienceCategory | Physics, Condensed Matter | - |
dc.subject.keywordPlus | Computer simulation | - |
dc.subject.keywordPlus | Corrosion | - |
dc.subject.keywordPlus | Electrochemical properties | - |
dc.subject.keywordPlus | Friction | - |
dc.subject.keywordPlus | Polishing | - |
dc.subject.keywordPlus | Slurries | - |
dc.subject.keywordPlus | Frictional properties | - |
dc.subject.keywordPlus | Oxide fields | - |
dc.subject.keywordPlus | Pattern dependence | - |
dc.subject.keywordPlus | Copper | - |
dc.subject.keywordAuthor | Corrosion | - |
dc.subject.keywordAuthor | Cu CMP | - |
dc.subject.keywordAuthor | Friction | - |
dc.subject.keywordAuthor | Pattern dependence | - |
dc.identifier.url | https://www.scientific.net/SSP.103-104.369 | - |
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