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Thickness effect on magnetic properties of nanocrystalline CoFeBN soft magnetic thin films
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Jeon, HJ | - |
| dc.contributor.author | Kim, I | - |
| dc.contributor.author | Kim, J | - |
| dc.contributor.author | Kim, KH | - |
| dc.contributor.author | Yamaguchi, M | - |
| dc.date.accessioned | 2021-06-24T00:40:24Z | - |
| dc.date.available | 2021-06-24T00:40:24Z | - |
| dc.date.created | 2021-01-21 | - |
| dc.date.issued | 2004-05 | - |
| dc.identifier.issn | 0304-8853 | - |
| dc.identifier.uri | https://scholarworks.bwise.kr/erica/handle/2021.sw.erica/46594 | - |
| dc.description.abstract | The thickness dependence of magnetic properties was examined in nanocrystalline CoFeBN films fabricated by a RF magnetron sputtering method. It was revealed that the coercivity of the films abruptly increased at a critical thickness without any noticeable microstructural difference. In addition, high B, N contents decreased the critical thickness. These behaviors were discussed in connection with residual film stress. (C) 2004 Elsevier B.V. All rights reserved. | - |
| dc.language | 영어 | - |
| dc.language.iso | en | - |
| dc.publisher | ELSEVIER | - |
| dc.title | Thickness effect on magnetic properties of nanocrystalline CoFeBN soft magnetic thin films | - |
| dc.type | Article | - |
| dc.contributor.affiliatedAuthor | Kim, J | - |
| dc.identifier.doi | 10.1016/j.jmmm.2003.11.153 | - |
| dc.identifier.scopusid | 2-s2.0-23044499140 | - |
| dc.identifier.wosid | 000222236500170 | - |
| dc.identifier.bibliographicCitation | JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS, v.272, pp.382 - 384 | - |
| dc.relation.isPartOf | JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS | - |
| dc.citation.title | JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS | - |
| dc.citation.volume | 272 | - |
| dc.citation.startPage | 382 | - |
| dc.citation.endPage | 384 | - |
| dc.type.rims | ART | - |
| dc.type.docType | Article; Proceedings Paper | - |
| dc.description.journalClass | 1 | - |
| dc.description.isOpenAccess | N | - |
| dc.description.journalRegisteredClass | scie | - |
| dc.description.journalRegisteredClass | scopus | - |
| dc.relation.journalResearchArea | Materials Science | - |
| dc.relation.journalResearchArea | Physics | - |
| dc.relation.journalWebOfScienceCategory | Materials Science, Multidisciplinary | - |
| dc.relation.journalWebOfScienceCategory | Physics, Condensed Matter | - |
| dc.subject.keywordPlus | CRYSTALLINE | - |
| dc.subject.keywordAuthor | soft magnetic thin film | - |
| dc.subject.keywordAuthor | anisotropy | - |
| dc.subject.keywordAuthor | thickness effect | - |
| dc.identifier.url | https://www.sciencedirect.com/science/article/pii/S0304885303010837?via%3Dihub | - |
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Related Researcher
- Kim, Jong ryoul
- ERICA 공학대학 (DEPARTMENT OF MATERIALS SCIENCE AND CHEMICAL ENGINEERING)