Detailed Information
Cited 0 time in 
Cited 0 time in 
Cited 0 time in
Metadata Downloads
Optical properties of the SiO-Co composite thin films
Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Lee, Jaeho | - |
| dc.contributor.author | Bang, Kyoung-Yoon | - |
| dc.contributor.author | Kim, Ok-Kyung | - |
| dc.contributor.author | Oh, Hye-Keun | - |
| dc.contributor.author | An, Ilsin | - |
| dc.contributor.author | Choi, Chaungi | - |
| dc.contributor.author | Park, Chang-Won | - |
| dc.date.accessioned | 2021-06-24T00:44:17Z | - |
| dc.date.available | 2021-06-24T00:44:17Z | - |
| dc.date.issued | 2003-03 | - |
| dc.identifier.issn | 0021-4922 | - |
| dc.identifier.issn | 1347-4065 | - |
| dc.identifier.uri | https://scholarworks.bwise.kr/erica/handle/2021.sw.erica/46714 | - |
| dc.description.abstract | Spectroscopic ellipsometry (SE) and X-ray photoelectron spectroscopy (XPS) were employed to study the composite thin films of SiO and cobalt (Co) prepared by sputtering technique. The optical properties of these films could be expressed as mixtures of SiO and Co using effective medium approximation (EMA) by Bruggeman. When the compositional properties of films analyzed by EMA and XPS were compared, the optical volume of SiO was found to be 5.47 times greater than that of Co. | - |
| dc.format.extent | 2 | - |
| dc.language | 영어 | - |
| dc.language.iso | ENG | - |
| dc.publisher | IOP Publishing Ltd | - |
| dc.title | Optical properties of the SiO-Co composite thin films | - |
| dc.type | Article | - |
| dc.publisher.location | 영국 | - |
| dc.identifier.doi | 10.1143/JJAP.42.1416 | - |
| dc.identifier.scopusid | 2-s2.0-0038290673 | - |
| dc.identifier.wosid | 000182276000064 | - |
| dc.identifier.bibliographicCitation | Japanese Journal of Applied Physics, v.42, no.3, pp 1416 - 1417 | - |
| dc.citation.title | Japanese Journal of Applied Physics | - |
| dc.citation.volume | 42 | - |
| dc.citation.number | 3 | - |
| dc.citation.startPage | 1416 | - |
| dc.citation.endPage | 1417 | - |
| dc.type.docType | Article | - |
| dc.description.isOpenAccess | N | - |
| dc.description.journalRegisteredClass | scie | - |
| dc.description.journalRegisteredClass | scopus | - |
| dc.relation.journalResearchArea | Physics | - |
| dc.relation.journalWebOfScienceCategory | Physics, Applied | - |
| dc.subject.keywordPlus | ELLIPSOMETRY | - |
| dc.subject.keywordAuthor | SiO | - |
| dc.subject.keywordAuthor | cobalt | - |
| dc.subject.keywordAuthor | ellipsometry | - |
| dc.subject.keywordAuthor | effective medium theory | - |
| dc.identifier.url | https://iopscience.iop.org/article/10.1143/JJAP.42.1416 | - |
- Files in This Item
- Go to Link
Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.