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Hydrogen-induced degradation in ferroelectric Bi3.25La0.75Ti3O12
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Seo, S | - |
| dc.contributor.author | Yoon, JG | - |
| dc.contributor.author | Kim, JD | - |
| dc.contributor.author | Song, TK | - |
| dc.contributor.author | Kang, BS | - |
| dc.contributor.author | Noh, TW | - |
| dc.contributor.author | Lee, YK | - |
| dc.contributor.author | Kim, CJ | - |
| dc.contributor.author | Lee, IS | - |
| dc.contributor.author | Lee, JK | - |
| dc.contributor.author | Park, YS | - |
| dc.date.accessioned | 2021-06-24T00:46:21Z | - |
| dc.date.available | 2021-06-24T00:46:21Z | - |
| dc.date.issued | 2002-09 | - |
| dc.identifier.issn | 0003-6951 | - |
| dc.identifier.issn | 1077-3118 | - |
| dc.identifier.uri | https://scholarworks.bwise.kr/erica/handle/2021.sw.erica/46789 | - |
| dc.description.abstract | Effects of forming gas annealing (FGA) were investigated on ferroelectric Bi3.25La0.75Ti3O12 (BLT) thin films fabricated by a chemical solution deposition. With the FGA up to 350 degreesC, the Pt/BLT/Pt capacitors showed good ferroelectric characteristics without significant degradation. As the FGA temperature was increased, a decomposition of the BLT powder sample was observed by using thermogravimetric analysis. By comparing the time-dependent weight loss of BLT with that of Bi4Ti3O12 during FGA, La doping was found to significantly impede the decomposition rate. The decomposition, especially in the (Bi2O2)(2+) layers, was discussed as a hydrogen-induced degradation mechanism in the Bi-layered perovskite ferroelectrics. (C) 2002 American Institute of Physics. | - |
| dc.format.extent | 3 | - |
| dc.language | 영어 | - |
| dc.language.iso | ENG | - |
| dc.publisher | AMER INST PHYSICS | - |
| dc.title | Hydrogen-induced degradation in ferroelectric Bi3.25La0.75Ti3O12 | - |
| dc.type | Article | - |
| dc.publisher.location | 미국 | - |
| dc.identifier.doi | 10.1063/1.1505110 | - |
| dc.identifier.scopusid | 2-s2.0-79956021387 | - |
| dc.identifier.wosid | 000177676200036 | - |
| dc.identifier.bibliographicCitation | APPLIED PHYSICS LETTERS, v.81, no.10, pp 1857 - 1859 | - |
| dc.citation.title | APPLIED PHYSICS LETTERS | - |
| dc.citation.volume | 81 | - |
| dc.citation.number | 10 | - |
| dc.citation.startPage | 1857 | - |
| dc.citation.endPage | 1859 | - |
| dc.type.docType | Article | - |
| dc.description.isOpenAccess | N | - |
| dc.description.journalRegisteredClass | scie | - |
| dc.description.journalRegisteredClass | scopus | - |
| dc.relation.journalResearchArea | Physics | - |
| dc.relation.journalWebOfScienceCategory | Physics, Applied | - |
| dc.subject.keywordPlus | TRANSMISSION ELECTRON-MICROSCOPY | - |
| dc.subject.keywordPlus | THIN-FILMS | - |
| dc.subject.keywordPlus | TI)O-3 | - |
| dc.subject.keywordPlus | PB(ZR | - |
| dc.subject.keywordPlus | POLARIZATION | - |
| dc.subject.keywordPlus | CAPACITORS | - |
| dc.identifier.url | https://aip.scitation.org/doi/10.1063/1.1505110 | - |
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Related Researcher
- Kang, Bo Soo
- ERICA 첨단융합대학 (ERICA 지능정보양자공학전공)