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Application of comparison imaging ellipsometry to crystallization of indium oxide thin films
- Authors
- 김수은
- Issue Date
- 28-May-2019
- Place
- Barcelona, Spain
- Conference Name
- 8th International Conference on Spectroscopic Ellipsometry
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Related Researcher
- Kim, Su enne
- COLLEGE OF SCIENCE AND CONVERGENCE TECHNOLOGY (DEPARTMENT OF PHOTONICS AND NANOELECTRONICS)