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Investigation of Luminance Degradation in Organic Light-Emitting Diodes by Impedance Spectroscopy
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Lee, Gyeong Won | - |
| dc.contributor.author | Kim, Heejin | - |
| dc.contributor.author | Park, Jongwoo | - |
| dc.contributor.author | Shim, Jong-In | - |
| dc.contributor.author | Shin, Dong-Soo | - |
| dc.date.accessioned | 2021-06-22T11:42:40Z | - |
| dc.date.available | 2021-06-22T11:42:40Z | - |
| dc.date.issued | 2018-07 | - |
| dc.identifier.issn | 1041-1135 | - |
| dc.identifier.issn | 1941-0174 | - |
| dc.identifier.uri | https://scholarworks.bwise.kr/erica/handle/2021.sw.erica/5774 | - |
| dc.description.abstract | We characterize the degradation of organic light-emitting diodes (OLEDs) by employing the impedance spectroscopy. An integrated OLED is compared with the hole only device (HOD) and the electron-only device to understand the degradation mechanism under voltage stress for 12 h in ambient conditions. Changes in impedance observed from the Cole-Cole plot of the HOD reveal that the degradation mechanism of the OLED is attributed to unbalanced recombination resulting from the deterioration of hole injection into the emissive layer. | - |
| dc.format.extent | 3 | - |
| dc.language | 영어 | - |
| dc.language.iso | ENG | - |
| dc.publisher | Institute of Electrical and Electronics Engineers | - |
| dc.title | Investigation of Luminance Degradation in Organic Light-Emitting Diodes by Impedance Spectroscopy | - |
| dc.type | Article | - |
| dc.publisher.location | 미국 | - |
| dc.identifier.doi | 10.1109/LPT.2018.2838099 | - |
| dc.identifier.scopusid | 2-s2.0-85047197528 | - |
| dc.identifier.wosid | 000435349900005 | - |
| dc.identifier.bibliographicCitation | IEEE Photonics Technology Letters, v.30, no.13, pp 1183 - 1185 | - |
| dc.citation.title | IEEE Photonics Technology Letters | - |
| dc.citation.volume | 30 | - |
| dc.citation.number | 13 | - |
| dc.citation.startPage | 1183 | - |
| dc.citation.endPage | 1185 | - |
| dc.type.docType | Article | - |
| dc.description.isOpenAccess | N | - |
| dc.description.journalRegisteredClass | sci | - |
| dc.description.journalRegisteredClass | scie | - |
| dc.description.journalRegisteredClass | scopus | - |
| dc.relation.journalResearchArea | Engineering | - |
| dc.relation.journalResearchArea | Optics | - |
| dc.relation.journalResearchArea | Physics | - |
| dc.relation.journalWebOfScienceCategory | Engineering, Electrical & Electronic | - |
| dc.relation.journalWebOfScienceCategory | Optics | - |
| dc.relation.journalWebOfScienceCategory | Physics, Applied | - |
| dc.subject.keywordPlus | SMALL-MOLECULE | - |
| dc.subject.keywordPlus | DEVICES | - |
| dc.subject.keywordPlus | ELECTROLUMINESCENCE | - |
| dc.subject.keywordPlus | MECHANISMS | - |
| dc.subject.keywordAuthor | Organic light-emitting diodes | - |
| dc.subject.keywordAuthor | impedance spectroscopy | - |
| dc.subject.keywordAuthor | degradation | - |
| dc.identifier.url | https://ieeexplore.ieee.org/document/8361021 | - |
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- Shin, Dong Soo
- ERICA 첨단융합대학 (ERICA 반도체·디스플레이공학전공)