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Spalling of Thin Si Layer via Electroless and Electrodeposit-Assisted Stripping (E(2)AS) with All-Wet Process for Fabrication of Low-Cost Flexible Single-Crystalline Si Solar Cell

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dc.contributor.authorYang, Changyol-
dc.contributor.authorMoon, Kyounghoon-
dc.contributor.authorSong, Jae-Won-
dc.contributor.authorKim, Jiwon-
dc.contributor.authorLee, Jung-Ho-
dc.contributor.authorLim, Jae-Hong-
dc.contributor.authorYoo, Bongyoung-
dc.date.accessioned2021-06-22T13:03:52Z-
dc.date.available2021-06-22T13:03:52Z-
dc.date.created2021-01-21-
dc.date.issued2018-04-
dc.identifier.issn0013-4651-
dc.identifier.urihttps://scholarworks.bwise.kr/erica/handle/2021.sw.erica/8003-
dc.description.abstractA novel method using an all-wet process to reduce the cost of material in Si-based devices is described, called the electroless and electrodeposit-assisted stripping (E(2)AS) process. In this approach, a highly adhesive electroless Ni nanorod seed layer is formed on the Si substrate in place of a conventional high-cost physical vapor deposition (PVD) process. Then, a highly stressed Ni film is electrodeposited as the stress layer for lift-off of the Si thin film. Using the E2AS method, a thin Si film can be repetitively detached from a Si substrate without kerf loss, reducing the solar cell manufacturing cost. (C) 2018 The Electrochemical Society.-
dc.language영어-
dc.language.isoen-
dc.publisherElectrochemical Society, Inc.-
dc.titleSpalling of Thin Si Layer via Electroless and Electrodeposit-Assisted Stripping (E(2)AS) with All-Wet Process for Fabrication of Low-Cost Flexible Single-Crystalline Si Solar Cell-
dc.typeArticle-
dc.contributor.affiliatedAuthorLee, Jung-Ho-
dc.contributor.affiliatedAuthorYoo, Bongyoung-
dc.identifier.doi10.1149/2.1341805jes-
dc.identifier.scopusid2-s2.0-85046699298-
dc.identifier.wosid000431803900083-
dc.identifier.bibliographicCitationJournal of the Electrochemical Society, v.165, no.5, pp.D243 - D249-
dc.relation.isPartOfJournal of the Electrochemical Society-
dc.citation.titleJournal of the Electrochemical Society-
dc.citation.volume165-
dc.citation.number5-
dc.citation.startPageD243-
dc.citation.endPageD249-
dc.type.rimsART-
dc.type.docTypeArticle-
dc.description.journalClass1-
dc.description.isOpenAccessN-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaElectrochemistry-
dc.relation.journalResearchAreaMaterials Science-
dc.relation.journalWebOfScienceCategoryElectrochemistry-
dc.relation.journalWebOfScienceCategoryMaterials Science, Coatings & Films-
dc.subject.keywordPlusSILICON-
dc.subject.keywordPlusFILMS-
dc.subject.keywordPlusACTIVATION-
dc.subject.keywordPlusDEPOSITION-
dc.subject.keywordPlusEFFICIENCY-
dc.subject.keywordPlusSTRESS-
dc.subject.keywordAuthorSILICON-
dc.subject.keywordAuthorFILMS-
dc.subject.keywordAuthorACTIVATION-
dc.subject.keywordAuthorDEPOSITION-
dc.subject.keywordAuthorEFFICIENCY-
dc.subject.keywordAuthorSTRESS-
dc.subject.keywordAuthorectrodeposition-
dc.subject.keywordAuthorsolar cell-
dc.subject.keywordAuthorthin Si layer-
dc.identifier.urlhttps://iopscience.iop.org/article/10.1149/2.1341805jes-
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ERICA 공학대학 (DEPARTMENT OF MATERIALS SCIENCE AND CHEMICAL ENGINEERING)
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