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SCIE
SCOPUS
Transformer-Coupled Loopback Test for Differential Mixed-Signal Dynamic Specifications
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Kim, Byoungho
; Abraham, Jacob A.
Article
Issue Date
2011
Citation
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, v.60, no.6, pp.2014 - 2024
Publisher
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
SCIE
SCOPUS
Efficient Loopback Test for Aperture Jitter in Embedded Mixed-Signal Circuits
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Kim, Byoungho
; Abraham, Jacob A.
Article
Issue Date
2011
Citation
IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I-REGULAR PAPERS, v.58, no.8, pp.1773 - 1784
Publisher
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
1
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Author
Abraham, Jacob A.
2
Kim, Byoung ho
2
Subject
loopback test
2
A/D CONVERTERS
1
Analog and mixed-signal testing
1
Analog-to-digital converter
1
aperture jitter
1
BIST
1
built-in self-test (BIST)
1
BUILT-IN-TEST
1
built-off self-test (BOST)
1
CLOCK JITTER
1
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