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Experimental Exploitation of Random and Deterministic Data Patterns for Stringent DDR4 I/O Timing Margins
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Lee, Kiseok; Li, Tan;
Baeg, Sanghyeon
Article
Issue Date
2019
Citation
JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE, v.19, no.4, pp.388 - 395
Publisher
IEEK PUBLICATION CENTER
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Author
Lee, Kiseok
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Li, Tan
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DDR4 I/O timing margins
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interconnect fault model
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Programmable memory built-In self...
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pseudo-random binary sequence (PRBS)
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2019
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English
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JOURNAL OF SEMICONDUCTOR TECHNOLO...
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