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SCIE
SCOPUS
Imbalance-Based Self-Test for High-Speed Mixed-Signal Embedded Systems
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Kim, Byoungho
; Abraham, Jacob A.
Article
Issue Date
2012
Citation
IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS II-EXPRESS BRIEFS, v.59, no.11, pp.785 - 789
Publisher
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
SCIE
SCOPUS
Capacitor-Coupled Built-Off Self-Test in Analog and Mixed-Signal Embedded Systems
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Kim, Byoungho
; Abraham, Jacob A.
Article
Issue Date
2013
Citation
IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS II-EXPRESS BRIEFS, v.60, no.5, pp.257 - 261
Publisher
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
SCIE
SCOPUS
Bitstream-Driven Built-In Characterization for Analog and Mixed-Signal Embedded Circuits
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Kim, Byoungho
; Abraham, Jacob A.
Article
Issue Date
2014
Citation
IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS II-EXPRESS BRIEFS, v.61, no.10, pp.743 - 747
Publisher
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
SCIE
SCOPUS
Dynamic Performance Characterization of Embedded Single-Ended Mixed-Signal Circuits
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Kim, Byoungho
; Abraham, Jacob A.
Article
Issue Date
2014
Citation
IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS II-EXPRESS BRIEFS, v.61, no.5, pp.329 - 333
Publisher
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
1
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Author
Abraham, Jacob A.
4
Kim, Byoung ho
4
Subject
Analog-to-digital converter (ADC)
4
loopback test
4
LOOPBACK TEST
3
differential mixed-signal testing
2
DIAGNOSIS
1
mixed-signal circuit testing
1
mixed-signal testing
1
Date Issued
2014
2
2013
1
2012
1
Type
Article
4
Language
English
4
Journal
IEEE Transactions on Circuits and...
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scie
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