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New multivariate kernel density estimator for uncertain data classification

Authors
Kim, ByunghoonJeong, Young-SeonJeong, Myong K.
Issue Date
Aug-2021
Publisher
SPRINGER
Keywords
Uncertain classification; Kernel density estimator; Bayesian classifier; Semiconductor DRAM
Citation
ANNALS OF OPERATIONS RESEARCH, v.303, no.1-2, pp 413 - 431
Pages
19
Indexed
SCIE
SCOPUS
Journal Title
ANNALS OF OPERATIONS RESEARCH
Volume
303
Number
1-2
Start Page
413
End Page
431
URI
https://scholarworks.bwise.kr/erica/handle/2021.sw.erica/931
DOI
10.1007/s10479-020-03715-4
ISSN
0254-5330
1572-9338
Abstract
Uncertainty in data occurs in diverse applications due to measurement errors, data incompleteness, and multiple repeated measurements. Several classifiers for uncertain data have been developed to tackle this uncertainty. However, the existing classifiers do not consider the dependencies among uncertain features, even though this dependency has a critical effect on classification accuracy. Therefore, we propose a new Bayesian classification model that considers the correlation among uncertain features. To handle the uncertainty of data, new multivariate kernel density estimators are developed to estimate the class conditional probability density function of categorical, continuous, and mixed uncertain data. Experimental results with simulated data and real-life data sets show that the proposed approach is better than the existing approaches for classification of uncertain data in terms of classification accuracy.
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COLLEGE OF ENGINEERING SCIENCES > DEPARTMENT OF INDUSTRIAL & MANAGEMENT ENGINEERING > 1. Journal Articles

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Kim, Byunghoon
ERICA 공학대학 (DEPARTMENT OF INDUSTRIAL & MANAGEMENT ENGINEERING)
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