Lee, Dong-Hun; Kim, Hyojeong; Yun, Hee Young; Park, Meejung; Choe, Sanggil; In, Sanghwan; Kim, Eunmi; Han, Eunyoung; Shin, Kyung-Hoon
ArticleIssue Date2019CitationRapid Communications in Mass Spectrometry, v.33, no.18, pp.1434 - 1439PublisherJohn Wiley & Sons Inc.