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Properties of Cu2O Thin Films for All-Oxide Solar Cells

Authors
Lee, Gye CheolJung, Yu SupKim, Kyung Hwan
Issue Date
24-Jul-2014
Publisher
TAYLOR & FRANCIS LTD
Keywords
oxygen partial pressure ratio; RF magnetron sputtering; Cu2O
Citation
MOLECULAR CRYSTALS AND LIQUID CRYSTALS, v.598, no.1, pp.62 - 68
Journal Title
MOLECULAR CRYSTALS AND LIQUID CRYSTALS
Volume
598
Number
1
Start Page
62
End Page
68
URI
https://scholarworks.bwise.kr/gachon/handle/2020.sw.gachon/12475
DOI
10.1080/15421406.2014.933299
ISSN
1542-1406
Abstract
In this work, p-type Cu2O thin films deposited by RF magnetron sputtering for Cu2O based all metal oxide solar cells were studied as a function of oxygen partial pressure ratio at room temperature. The Cu2O (111) x-ray diffraction peaks were indicated as a function of oxygen partial pressure ratio. Optical band gap energies of as-deposited Cu2O thin films ranged from 1.88 to 1.96eV as a function of oxygen partial pressure ratio. The resistivity and mobility of the p-type Cu2O thin film with an oxygen partial pressure ratio of 2.4% was 2 x10(4) omega center dot cm and 15.1cm(2)/V center dot s, respectively.
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College of IT Convergence (Department of Electrical Engineering)
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