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In-situ X-ray microdiffraction analysis of local strain-field across the interface in a Pb(Zr0.52Ti0.48)O-3/Ni0.8Zn0.2Fe2O4/Pb(Zr0.52Ti0.48)O-3 tri-layered structure
- Authors
- Ahn, Suk-Jin; Bark, Chung Wung; Jeong, Young Kyu
- Issue Date
- Apr-2014
- Publisher
- ELSEVIER SCIENCE BV
- Keywords
- Microdiffraction; Piezoelectric strain; Magnetostriction; Magnetoelectric
- Citation
- CURRENT APPLIED PHYSICS, v.14, no.4, pp.582 - 585
- Journal Title
- CURRENT APPLIED PHYSICS
- Volume
- 14
- Number
- 4
- Start Page
- 582
- End Page
- 585
- ISSN
- 1567-1739
- Abstract
- We have performed a synchrotron X-ray microdiffraction to investigate the variation of the local strain-field across the interface in Pb(Zr0.52Ti0.48)O-3/Ni0.8Zn0.2Fe2O4/Pb(Zr0.52Ti0.48)O-3 (PZT-NZFO-PZT) tri-layered structure. In this study, we show that the in-plane lattice parameters of the NZFO lattice depend strongly on the piezoelectric strain of the PZT layer. This result explains that an electric-field-induced piezoelectric strain from the PZT layer is effectively transferred to the NZFO layer. Furthermore, the local strain persists within 20 mu m away from the interface, inducing changes of magnetic responses via the inverse magnetostrictive effect. (C) 2014 Elsevier B.V. All rights reserved.
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Related Researcher
- Bark, Chung Wung
- College of IT Convergence (Department of Electrical Engineering)