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Characterization of GeSn deposited on Si by low-temperature sputter epitaxy
- Authors
- 조성재
- Issue Date
- 23-Feb-2016
- Conference Name
- Abstract of the 23rd KCS
- Place
- 대한민국
강원도 하이원리조트
- metadata.conference.dc.citation.conferenceName
- The 23rd Korean Conference on Semiconductors (KCS)
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Collections - IT융합대학 > 전자공학과 > 2. Conference Papers
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Related Researcher
- Cho, Seong Jae
- IT (Major of Electronic Engineering)