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Novel extraction method for source and drain series resistances in silicon nanowire metal-oxide-semiconductor field-effect-transistors based on radio-frequency analysis

Authors
조성재
Issue Date
10-Jul-2013
URI
https://scholarworks.bwise.kr/gachon/handle/2020.sw.gachon/29356
Conference Name
Proceedings of the 11th International Nanotech Symposium & Nano-Convergence Expo (Nano Korea)
Place
대한민국
Seoul, Korea
metadata.conference.dc.citation.conferenceName
The 11th International Nanotech Symposium & Nano-Convergence Expo (Nano Korea)
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IT (Major of Electronic Engineering)
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