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A new Analysis of Photo Leakage Currents of a-Si:H TFT in terms of Spectral Characteristics of CCFL Backlight
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 조의식 | - |
| dc.date.available | 2020-04-24T18:43:47Z | - |
| dc.date.issued | 2008-07-04 | - |
| dc.identifier.uri | https://scholarworks.bwise.kr/gachon/handle/2020.sw.gachon/35289 | - |
| dc.title | A new Analysis of Photo Leakage Currents of a-Si:H TFT in terms of Spectral Characteristics of CCFL Backlight | - |
| dc.title.alternative | A new Analysis of Photo Leakage Currents of a-Si:H TFT in terms of Spectral Characteristics of CCFL Backlight | - |
| dc.type | Conference | - |
| dc.citation.conferenceName | The 22nd International Liquid Crystal Conference (ILCC 2008) | - |
| dc.citation.conferencePlace | 대한민국 | - |
| dc.citation.conferencePlace | ICC Jeju, Jeju | - |
| dc.citation.endPage | 170 | - |
| dc.citation.startPage | 170 | - |
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