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A new Analysis of Photo Leakage Currents of a-Si:H TFT in terms of Spectral Characteristics of CCFL BacklightA new Analysis of Photo Leakage Currents of a-Si:H TFT in terms of Spectral Characteristics of CCFL Backlight
- Alternative Title
- A new Analysis of Photo Leakage Currents of a-Si:H TFT in terms of Spectral Characteristics of CCFL Backlight
- Authors
- 조의식
- Issue Date
- 4-Jul-2008
- Place
- 대한민국
ICC Jeju, Jeju
- metadata.conference.dc.citation.conferenceName
- The 22nd International Liquid Crystal Conference (ILCC 2008)
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Collections - IT융합대학 > 전자공학과 > 2. Conference Papers
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