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SiON MOSFET의 전기적 계면 트랩에 대한 양자화학적 연구Quantum chemical study of electrically active interface traps in SiON MOSFETs
- Alternative Title
- Quantum chemical study of electrically active interface traps in SiON MOSFETs
- Authors
- 이은철
- Issue Date
- 4-Oct-2007
- Place
- South Korea
연세대학교
- metadata.conference.dc.citation.conferenceName
- 한국전기화학회 추계학술대회
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Collections - 바이오나노대학 > 나노물리학과 > 2. Conference Papers
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Related Researcher
- Lee, Eun Cheol
- BioNano Technology (Department of Physics)