Seo, J.H.; Yoon, Y.J.; Lee, H.G.; Yoo, G.M.; Kim, Y.J.; Kim, S.Y.; Woo, S.Y.; Roh, H.B.; Eun, H.R.; Kang, H.S., et al.
ArticleIssue Date2014CitationProceedings - 2014 6th International Conference on Measuring Technology and Mechatronics Automation, ICMTMA 2014, pp.762 - 765PublisherIEEE Computer Society