Detailed Information

Cited 34 time in webofscience Cited 40 time in scopus
Metadata Downloads

Comprehensive Review on Amorphous Oxide Semiconductor Thin Film Transistor

Full metadata record
DC Field Value Language
dc.contributor.authorLee, Sang Yeol-
dc.date.available2020-10-20T06:42:12Z-
dc.date.created2020-08-25-
dc.date.issued2020-06-
dc.identifier.issn1229-7607-
dc.identifier.urihttps://scholarworks.bwise.kr/gachon/handle/2020.sw.gachon/78479-
dc.description.abstractOxide materials are one of the most advanced key technology in the thin film transistors (TFTs) for the high-end of device applications. Amorphous oxide semiconductors (AOSs) have leading technique for flat panel display, active matrix organic light emitting display, active matrix liquid crystal display as well as thin film electronic devices due to their excellent electrical characteristics, such as field effect mobility (mu(FE)), subthreshold swing (SS) and threshold voltage (V-th). Researchers from various fields have studied and considered ways to improve mu(FE) of AOS TFT, which has been studied for 16 years since 2004. Since 2004, mobility has been increased by using various methods, such as designing novel amorphous oxide materials, changing device structures, or adopting new post-treatment. The development of field effect mobility as well as the stability enhancement has been comprehensively reviewed in this report.-
dc.language영어-
dc.language.isoen-
dc.publisherKorean Institute of Electrical and Electronic Material Engineers-
dc.relation.isPartOfTransactions on Electrical and Electronic Materials-
dc.titleComprehensive Review on Amorphous Oxide Semiconductor Thin Film Transistor-
dc.typeArticle-
dc.type.rimsART-
dc.description.journalClass1-
dc.identifier.wosid000524643100001-
dc.identifier.doi10.1007/s42341-020-00197-w-
dc.identifier.bibliographicCitationTransactions on Electrical and Electronic Materials, v.21, no.3, pp.235 - 248-
dc.identifier.kciidART002595295-
dc.description.isOpenAccessN-
dc.identifier.scopusid2-s2.0-85083399998-
dc.citation.endPage248-
dc.citation.startPage235-
dc.citation.titleTransactions on Electrical and Electronic Materials-
dc.citation.volume21-
dc.citation.number3-
dc.contributor.affiliatedAuthorLee, Sang Yeol-
dc.type.docTypeReview-
dc.subject.keywordAuthorAmorphous oxide semiconductor-
dc.subject.keywordAuthorThin film transistor-
dc.subject.keywordAuthorMobility-
dc.subject.keywordAuthorStability-
dc.subject.keywordAuthorComprehensive review-
dc.subject.keywordPlusMETAL CAPPING LAYER-
dc.subject.keywordPlusELECTRONIC-STRUCTURE-
dc.subject.keywordPlusHIGH-MOBILITY-
dc.subject.keywordPlusZN-O-
dc.subject.keywordPlusPERFORMANCE-
dc.subject.keywordPlusSTABILITY-
dc.subject.keywordPlusTRANSPORT-
dc.subject.keywordPlusDEFECTS-
dc.subject.keywordPlusOXYGEN-
dc.subject.keywordPlusTFTS-
dc.relation.journalResearchAreaMaterials Science-
dc.relation.journalWebOfScienceCategoryMaterials Science, Multidisciplinary-
dc.description.journalRegisteredClassscopus-
dc.description.journalRegisteredClasskci-
Files in This Item
There are no files associated with this item.
Appears in
Collections
IT융합대학 > 전자공학과 > 1. Journal Articles

qrcode

Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.

Related Researcher

Researcher Lee, Sang Yeol photo

Lee, Sang Yeol
반도체대학 (반도체·전자공학부)
Read more

Altmetrics

Total Views & Downloads

BROWSE