Detailed Information

Cited 34 time in webofscience Cited 40 time in scopus
Metadata Downloads

Comprehensive Review on Amorphous Oxide Semiconductor Thin Film Transistor

Authors
Lee, Sang Yeol
Issue Date
Jun-2020
Publisher
Korean Institute of Electrical and Electronic Material Engineers
Keywords
Amorphous oxide semiconductor; Thin film transistor; Mobility; Stability; Comprehensive review
Citation
Transactions on Electrical and Electronic Materials, v.21, no.3, pp.235 - 248
Journal Title
Transactions on Electrical and Electronic Materials
Volume
21
Number
3
Start Page
235
End Page
248
URI
https://scholarworks.bwise.kr/gachon/handle/2020.sw.gachon/78479
DOI
10.1007/s42341-020-00197-w
ISSN
1229-7607
Abstract
Oxide materials are one of the most advanced key technology in the thin film transistors (TFTs) for the high-end of device applications. Amorphous oxide semiconductors (AOSs) have leading technique for flat panel display, active matrix organic light emitting display, active matrix liquid crystal display as well as thin film electronic devices due to their excellent electrical characteristics, such as field effect mobility (mu(FE)), subthreshold swing (SS) and threshold voltage (V-th). Researchers from various fields have studied and considered ways to improve mu(FE) of AOS TFT, which has been studied for 16 years since 2004. Since 2004, mobility has been increased by using various methods, such as designing novel amorphous oxide materials, changing device structures, or adopting new post-treatment. The development of field effect mobility as well as the stability enhancement has been comprehensively reviewed in this report.
Files in This Item
There are no files associated with this item.
Appears in
Collections
IT융합대학 > 전자공학과 > 1. Journal Articles

qrcode

Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.

Related Researcher

Researcher Lee, Sang Yeol photo

Lee, Sang Yeol
반도체대학 (반도체·전자공학부)
Read more

Altmetrics

Total Views & Downloads

BROWSE