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Unified Compact Model for Thin-Film Heterojunction Anti-Ambipolar Transistors

Authors
Yoo, HocheonKim, Chang-Hyun
Issue Date
Sep-2021
Publisher
Institute of Electrical and Electronics Engineers Inc.
Keywords
Analytical models; anti-ambipolar transistors; Compact modeling; Heterojunctions; interface phenomena; Logic gates; Mathematical model; p-n heterojunction; Predictive models; thin-film electronics; Transistors; Voltage measurement
Citation
IEEE Electron Device Letters, v.42, no.9, pp.1323 - 1326
Journal Title
IEEE Electron Device Letters
Volume
42
Number
9
Start Page
1323
End Page
1326
URI
https://scholarworks.bwise.kr/gachon/handle/2020.sw.gachon/82088
DOI
10.1109/LED.2021.3102219
ISSN
0741-3106
Abstract
This letter proposes an advanced compact model for anti-ambipolar transistors based on a lateral thin-film material heterojunction. The modeling idea focuses on an analytical description of component currents and bridging methods necessary for controllable transition between operation regimes. The model is validated by experimental data, and predictive simulations are carried out to demonstrate its applicabilities. IEEE
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Yoo, Ho Cheon
반도체대학 (반도체·전자공학부)
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