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Cited 5 time in webofscience Cited 6 time in scopus
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Lopsided-Gating Leads to Multi-State and Photo-Switching Behaviors With Enhanced Photodetections

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dc.contributor.authorKim, Somi-
dc.contributor.authorYoo, Hocheon-
dc.contributor.authorHong, Seongin-
dc.date.accessioned2021-11-11T00:40:47Z-
dc.date.available2021-11-11T00:40:47Z-
dc.date.created2021-09-01-
dc.date.issued2021-10-
dc.identifier.issn1530-437X-
dc.identifier.urihttps://scholarworks.bwise.kr/gachon/handle/2020.sw.gachon/82648-
dc.description.abstractIn this paper, we propose a new gating scheme that optically turns on a phototransistor by means of a novel structure of lopsided gate. Different from the conventional structure in which the gate electrode overlaps both the source and drain electrodes, the new gate structure is lopsided to form an ungated region between the gate and source, or the gate and drain, allowing light to be detected even in the gate-on state. Furthermore, the proposed gating scheme enables the phototransistor to significantly enhance its photosensitivity as large as 2,200 times higher compared to the baseline in the conventional gate structure. Owing to the optically switching-on behavior in the proposed phototransistor, we also demonstrate that three distinct states can be obtained by a modulation of electrical and optical switches. IEEE-
dc.language영어-
dc.language.isoen-
dc.publisherInstitute of Electrical and Electronics Engineers Inc.-
dc.relation.isPartOfIEEE Sensors Journal-
dc.titleLopsided-Gating Leads to Multi-State and Photo-Switching Behaviors With Enhanced Photodetections-
dc.typeArticle-
dc.type.rimsART-
dc.description.journalClass1-
dc.identifier.wosid000709128900052-
dc.identifier.doi10.1109/JSEN.2021.3106308-
dc.identifier.bibliographicCitationIEEE Sensors Journal, v.21, no.20, pp.22638 - 22644-
dc.description.isOpenAccessN-
dc.identifier.scopusid2-s2.0-85113350272-
dc.citation.endPage22644-
dc.citation.startPage22638-
dc.citation.titleIEEE Sensors Journal-
dc.citation.volume21-
dc.citation.number20-
dc.contributor.affiliatedAuthorKim, Somi-
dc.contributor.affiliatedAuthorYoo, Hocheon-
dc.contributor.affiliatedAuthorHong, Seongin-
dc.type.docTypeArticle-
dc.subject.keywordAuthoramorphous silicon-
dc.subject.keywordAuthorCurrent measurement-
dc.subject.keywordAuthorDark current-
dc.subject.keywordAuthorElectrodes-
dc.subject.keywordAuthorField effect transistors-
dc.subject.keywordAuthorgate structure-
dc.subject.keywordAuthorLogic gates-
dc.subject.keywordAuthormulti switching-
dc.subject.keywordAuthorOptical switches-
dc.subject.keywordAuthorphoto transistor-
dc.subject.keywordAuthorphoto triggered-
dc.subject.keywordAuthorPhototransistors-
dc.subject.keywordPlusElectrodes-
dc.subject.keywordPlusOptical switches-
dc.subject.keywordPlusPhototransistors-
dc.subject.keywordPlusRefractory metal compounds-
dc.subject.keywordPlusConventional structures-
dc.subject.keywordPlusGate electrodes-
dc.subject.keywordPlusGate structure-
dc.subject.keywordPlusMulti-state-
dc.subject.keywordPlusNovel structures-
dc.subject.keywordPlusOn state-
dc.subject.keywordPlusSource and drain electrodes-
dc.subject.keywordPlusSwitching behaviors-
dc.subject.keywordPlusImage enhancement-
dc.relation.journalResearchAreaEngineering-
dc.relation.journalResearchAreaInstruments & Instrumentation-
dc.relation.journalResearchAreaPhysics-
dc.relation.journalWebOfScienceCategoryEngineering, Electrical & Electronic-
dc.relation.journalWebOfScienceCategoryInstruments & Instrumentation-
dc.relation.journalWebOfScienceCategoryPhysics, Applied-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
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