Detailed Information

Cited 5 time in webofscience Cited 6 time in scopus
Metadata Downloads

Lopsided-Gating Leads to Multi-State and Photo-Switching Behaviors With Enhanced Photodetections

Authors
Kim, SomiYoo, HocheonHong, Seongin
Issue Date
Oct-2021
Publisher
Institute of Electrical and Electronics Engineers Inc.
Keywords
amorphous silicon; Current measurement; Dark current; Electrodes; Field effect transistors; gate structure; Logic gates; multi switching; Optical switches; photo transistor; photo triggered; Phototransistors
Citation
IEEE Sensors Journal, v.21, no.20, pp.22638 - 22644
Journal Title
IEEE Sensors Journal
Volume
21
Number
20
Start Page
22638
End Page
22644
URI
https://scholarworks.bwise.kr/gachon/handle/2020.sw.gachon/82648
DOI
10.1109/JSEN.2021.3106308
ISSN
1530-437X
Abstract
In this paper, we propose a new gating scheme that optically turns on a phototransistor by means of a novel structure of lopsided gate. Different from the conventional structure in which the gate electrode overlaps both the source and drain electrodes, the new gate structure is lopsided to form an ungated region between the gate and source, or the gate and drain, allowing light to be detected even in the gate-on state. Furthermore, the proposed gating scheme enables the phototransistor to significantly enhance its photosensitivity as large as 2,200 times higher compared to the baseline in the conventional gate structure. Owing to the optically switching-on behavior in the proposed phototransistor, we also demonstrate that three distinct states can be obtained by a modulation of electrical and optical switches. IEEE
Files in This Item
There are no files associated with this item.
Appears in
Collections
IT융합대학 > 전자공학과 > 1. Journal Articles

qrcode

Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.

Related Researcher

Researcher Hong, Seongin photo

Hong, Seongin
BioNano Technology (Department of Physics)
Read more

Altmetrics

Total Views & Downloads

BROWSE