Phase-Controlled Artificial SiZnSnO/P(VDF-TrFE) Synaptic Devices with a High Dynamic Range for Neuromorphic Computing
- Authors
- Lee, Byeong Hyeon; Lee, Ji Ye; Kumar, Akash; Lee, Sang Yeol
- Issue Date
- Dec-2022
- Publisher
- WILEY
- Keywords
- amorphous oxide semiconductors; artificial synaptic devices; dynamic range; ferroelectric field-effect transistors; Modified National Institute of Standards and Technology (MNIST); P(VDF-TrFE)
- Citation
- ADVANCED ELECTRONIC MATERIALS, v.8, no.12
- Journal Title
- ADVANCED ELECTRONIC MATERIALS
- Volume
- 8
- Number
- 12
- URI
- https://scholarworks.bwise.kr/gachon/handle/2020.sw.gachon/86316
- DOI
- 10.1002/aelm.202200810
- ISSN
- 2199-160X
- Abstract
- Artificial synapses, such as ferroelectric field-effect transistors, aspire the brain-like computation in real life and are likely to replace conventional computing methods in the future. Amorphous SiZnSnO (a-SZTO)-based ferroelectric field-effect transistor is fabricated using the organic poly(vinylidene fluoride-trifluoroethylene) P(VDF-TrFE) ferroelectric gate insulating layer. First, the ferroelectric properties of P(VDF-TrFE) are analyzed depending on the crystallization temperature for artificial synaptic transistor applications. The ferroelectricity becomes prominent with the evolution of the beta-phase till 140 degrees C and degrades thereafter. The a-SZTO-based ferroelectric field-effect transistors employing P(VDF-TrFE) show anticlockwise hysteresis, typical for a ferroelectric field-effect transistor. The nonlinearity for the potentiation and depression and the dynamic range is confirmed to be increased with higher beta-phase concentration. The rise in the concentration is related to the elevated thermodynamic stability of the beta-phase between curie temperature and the melting point. Utilizing the parameters obtained from the a-SZTO-P(VDF-TrFE) synaptic transistor, the simulation studies exhibit a high recognition rate of 86.8%, which makes it a promising candidate for artificial intelligence applications.
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