Development of Adaptive Point-Spread Function Estimation Method in Various Scintillation Detector Thickness for X-ray Imaging

Abstract

An indirect conversion X-ray detector uses a scintillator that utilizes the proportionality of the intensity of incident radiation to the amount of visible light emitted. A thicker scintillator reduces the patient's dose while decreasing the sharpness. A thin scintillator has an advantage in terms of sharpness; however, its noise component increases. Thus, the proposed method converts the spatial resolution of radiographic images acquired from a normal-thickness scintillation detector into a thin-thickness scintillation detector. Note that noise amplification and artifacts were minimized as much as possible after non-blind deconvolution. To accomplish this, the proposed algorithm estimates the optimal point-spread function (PSF) when the structural similarity index (SSIM) and feature similarity index (FSIM) are the most similar between thick and thin scintillator images. Simulation and experimental results demonstrate the viability of the proposed method. Moreover, the deconvolution images obtained using the proposed scheme show an effective image restoration method in terms of the human visible system compared to that of the traditional PSF measurement technique. Consequently, the proposed method is useful for restoring degraded images using the adaptive PSF while preventing noise amplification and artifacts and is effective in improving the image quality in the present X-ray imaging system.