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An Area-Efficient Integrate-and-Fire Neuron Circuit with Enhanced Robustness against Synapse Variability in Hardware Neural Network

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dc.contributor.authorShah, Arati Kumari-
dc.contributor.authorUdaya Mohanan, Kannan-
dc.contributor.authorPark, Jisun-
dc.contributor.authorShin, Hyungsoon-
dc.contributor.authorCho, Eou-Sik-
dc.contributor.authorCho, Seongjae-
dc.date.accessioned2024-01-30T06:00:37Z-
dc.date.available2024-01-30T06:00:37Z-
dc.date.issued2023-12-
dc.identifier.issn1751-858X-
dc.identifier.issn1751-8598-
dc.identifier.urihttps://scholarworks.bwise.kr/gachon/handle/2020.sw.gachon/90243-
dc.description.abstractNeuron circuits are the fundamental building blocks in the modern neuromorphic system. Designing compact and low-power neuron circuits can significantly improve the overall area and energy efficiencies of a neuromorphic chip architecture. Here, practical neuron circuits must overcome the variations arising from nonideal behaviors of synaptic devices, such as stuck-at-fault and conductance deviation. In this study, a compact leaky integrate-and-fire neuron circuit has been designed, with resilience to synaptic device state variations, for hardware implementation of spiking neural networks (SNNs). The proposed neuron circuit is simulated on the 0.35-mu m Si complementary metal-oxide-semiconductor technology node by a series of circuit simulations based on HSPICE. The proposed circuit occupies a reduced area and exhibits low power consumption (14.7 mu W per spike). Furthermore, the optimized circuit design results in a high degree of tolerance toward input-current variations arising from conductance-state variations in the synapse array. Hence, the proposed neuron circuit would be capable of substantially improving the area efficiency and reliability in the realization of the hardware-oriented SNN architectures.-
dc.language영어-
dc.language.isoENG-
dc.publisherWILEY-HINDAWI-
dc.titleAn Area-Efficient Integrate-and-Fire Neuron Circuit with Enhanced Robustness against Synapse Variability in Hardware Neural Network-
dc.typeArticle-
dc.identifier.wosid001137288900001-
dc.identifier.doi10.1049/2023/1052063-
dc.identifier.bibliographicCitationIET CIRCUITS DEVICES & SYSTEMS, v.2023-
dc.description.isOpenAccessY-
dc.citation.titleIET CIRCUITS DEVICES & SYSTEMS-
dc.citation.volume2023-
dc.type.docTypeArticle-
dc.publisher.location영국-
dc.subject.keywordPlusSPIKING NEURONS-
dc.subject.keywordPlusMEMORY-
dc.subject.keywordPlusMODEL-
dc.subject.keywordPlusDEVICES-
dc.relation.journalResearchAreaEngineering-
dc.relation.journalWebOfScienceCategoryEngineering, Electrical & Electronic-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
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반도체대학 (반도체·전자공학부)
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