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Dual-Gate Operation and Configurable Logic From Solution Pattern-Based Zinc Tin Oxide Thin-Film Transistors

Authors
Seo, JuhyungKim, Chang-HyunYoo, Hocheon
Issue Date
May-2024
Publisher
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
Keywords
Thin film transistors; Logic gates; Mathematical models; Inverters; Dielectrics; Voltage measurement; Voltage control; Complementary inverter logic circuit; dual-gate structure; oxide semiconductors; solution-based film patterning; thin-film transistors (TFTs); threshold voltage control
Citation
IEEE TRANSACTIONS ON ELECTRON DEVICES, v.71, no.5, pp 3020 - 3025
Pages
6
Journal Title
IEEE TRANSACTIONS ON ELECTRON DEVICES
Volume
71
Number
5
Start Page
3020
End Page
3025
URI
https://scholarworks.bwise.kr/gachon/handle/2020.sw.gachon/91545
DOI
10.1109/TED.2024.3379157
ISSN
0018-9383
1557-9646
Abstract
The development of semiconductor technology is stimulating a significant amount of research into the synthesis of semiconductors and the structural aspects of devices. The liquid solution-based film patterning technology and dual-gate technology are considered promising because of their benefits of low cost and mass-production. At the same time, dual-gate extends the control of an existing device with the additional gate, offering the suitable device characteristics for various applications. The separate gates can offset or enhance the electric fields of each other to systematically control the density of charge inside the channel. In this study, a zinc-tin oxide (ZTO) thin-film transistor (TFT) fabricated via oxide semiconductor synthesis by solution patterning technology with a dual-gate structure is presented, and the electrical characteristics of the device controlled by dual-gate are presented along with a quantitative analysis by simulation. Furthermore, the fabricated dual-gate TFT demonstrates multifunctional logic circuit operation controlled by the dual-gate function through integration with pull-up transistors.
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Yoo, Ho Cheon
반도체대학 (반도체·전자공학부)
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