Trap-assisted tunneling in type II Ag2O/β-Ga2O3 self-powered solar blind photodetector
- Authors
- Labed, Madani; Kim, Kihwan; Kim, Kyung Hwan; Hong, Jeongsoo; Rim, You Seung
- Issue Date
- Jul-2024
- Publisher
- ELSEVIER SCIENCE SA
- Keywords
- Heterojunction; Photodetector; XPS; Modeling; Traps
- Citation
- SENSORS AND ACTUATORS A-PHYSICAL, v.372
- Journal Title
- SENSORS AND ACTUATORS A-PHYSICAL
- Volume
- 372
- URI
- https://scholarworks.bwise.kr/gachon/handle/2020.sw.gachon/91664
- DOI
- 10.1016/j.sna.2024.115368
- ISSN
- 0924-4247
1873-3069
- Abstract
- This study investigates a high-performance Ag2O/beta-Ga2O3 self-powered photodiode through experimental and modeling approaches. Initially, a p-type Ag2O film, with a bandgap close to 4 eV and a hole density of approximately 6.35x1018 cm-3, was fabricated using faced two-target sputtering. The conduction and valence band offsets between Ag2O and beta-Ga2O3 were determined via X-ray photoelectron spectroscopy, confirming a type II heterojunction. The device had a low on-voltage of 1.50 V and a low on-resistance of 5.40 m ohm.cm2 in the dark. Subsequent illumination at 254 nm resulted in a notably high photocurrent, responsivity, and detectivity. To confirm the role of trap-assisted tunneling in the type II Ag2O/beta-Ga2O3 heterojunction, Silvaco simulations were employed to model both the dark current and photocurrent. These simulations confirmed the prevalence of the trap-assisted tunneling mechanism, particularly through energy levels situated above the equilibrium Fermi level at the Ag2O/beta-Ga2O3 interface, as described by the Danielsson model. Understanding the transport mechanism is paramount for the development of high-performance photodetectors. By comprehending how charge carriers navigate through the device and the influence of traps on their behavior, researchers can optimize device design and fabrication processes to enhance performance.
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