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A High-Reliability Carry-Free Gate Driver for Flexible Displays Using a-IGZO TFTsGo to Link

Kim, Jong-Seok; Byun, Jung-Woo; Jang, Jun-Hwan; Kim, Yong-Duck; Han, Ki-Lim; Park, Jin-Seong; Choi, Byong-Deok

ArticleIssue Date2018CitationIEEE Transactions on Electron Devices, v.65, no.8, pp 3269 - 3276PublisherInstitute of Electrical and Electronics Engineers
SCISCIESCOPUS
Dynamic Logic Circuits Using a-IGZO TFTsGo to Link

Kim, Jong Seok; Jang, Jun-Hwan; Kim, Yong-Duck; Byun, Jung-Woo; Han, Kilim; Park, Jin-Seong; Choi, Byong-Deok

ArticleIssue Date2017CitationIEEE Transactions on Electron Devices, v.64, no.10, pp 4123 - 4130PublisherInstitute of Electrical and Electronics Engineers
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