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Origin of electrical improvement of amorphous TaInZnO TFT by oxygen thermo-pressure-induced processGo to Link

Du Ahn, Byung; Rim, You Seung; Kim, Hyun Jae; Lim, Jun Hyung; Chung, Kwun-Bum; Park, Jin-Seong

ArticleIssue Date2014CitationJournal of Physics D: Applied Physics, v.47, no.10, pp 1 - 9PublisherIOP Publishing Ltd.
SCISCIESCOPUS
The effect of the annealing temperature on the transition from conductor to semiconductor behavior in zinc tin oxide deposited atomic layer depositionGo to Link

Du Ahn, Byung; Choi, Dong-won; Choi, Changhwan; Park, Jin-Seong

ArticleIssue Date2014CitationApplied Physics Letters, v.105, no.9, pp 1 - 5PublisherAmerican Institute of Physics
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