Kim, Jong Seok; Jang, Jun-Hwan; Kim, Yong-Duck; Byun, Jung-Woo; Han, Kilim; Park, Jin-Seong; Choi, Byong-Deok
ArticleIssue Date2017CitationIEEE Transactions on Electron Devices, v.64, no.10, pp 4123 - 4130PublisherInstitute of Electrical and Electronics Engineers