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Effects of oxygen stoichiometry on resistive switching properties in amorphous tungsten oxide filmsGo to Link

Jang, Byeonguk; Inamdar, A. I.; Kim, Jongmin; Jung, Woong; Im, Hyunsik; Kim, Hyungsang; Hong, Jin Pyo

ArticleIssue Date2012CitationThin Solid Films, v.520, no.16, pp 5451 - 5454PublisherElsevier Sequoia
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