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10-bit Two-Step Single Slope ADC for A Low-Power CMOS Image SensorGo to Link

Jeon, Duhyun; Lee, Don-gu; Choi, Byong-Deok

ConferenceIssue Date2014Citation제21회 한국반도체학술대회, pp.244Publisher대한전자공학회 외PlaceKO; 한양대학교
SCIESCOPUS
A 325F(2) Physical Unclonable Function Based on Contact Failure Probability With Bit Error Rate < 0.43 ppm After Preselection With 0.0177% Discard RatioGo to Link

Jeon, Duhyun; 이동민; Kim, Dong Kyue; Choi, Byong-Deok

ArticleIssue Date2023CitationIEEE Journal of Solid-State Circuits, v.58, no.4, pp 1185 - 1196PublisherInstitute of Electrical and Electronics Engineers
SCIESCOPUS
A Physical Unclonable Function With Bit Error Rate < 2.3 $\times$ 10(-8) Based on Contact Formation Probability Without Error Correction CodeGo to Link

Jeon, Duhyun; Baek, Jong Hak; Kim, Yong-Duck; Lee, Jaeseong; Kim, Dong Kyue; Choi, Byong-Deok

ArticleIssue Date2020CitationIEEE Journal of Solid-State Circuits, v.55, no.3, pp 805 - 816PublisherInstitute of Electrical and Electronics Engineers
Capacitive Touch Screen Panel Readout Circuit against Display NoiseGo to Link

Jeon, Duhyun; Kim, Hyun-Woo; Choi, Byong-Deok

ConferenceIssue Date2014Citation제21회 한국반도체학술대회, pp.243Publisher대한전자공학회 외PlaceKO; 한양대학교
SCOPUS
Circuit design of physical unclonable function for security applications in standard CMOS technologyGo to Link

Jeon, Duhyun; Choi, Byong-Deok

ArticleIssue Date2016Citation2016 IEEE International Conference on Electron Devices and Solid-State Circuits, EDSSC 2016, pp 86 - 90PublisherInstitute of Electrical and Electronics Engineers Inc.
SCOPUS
Towards zero bit-error-rate physical unclonable function: Mismatch-based vs. Physical-based approaches in standard CMOS technologyGo to Link

Jeon, Duhyun; Baek, Jong Hak; Kim, Dong Kyue; Choi, Byong-Deok

ArticleIssue Date2015CitationProceedings - 18th Euromicro Conference on Digital System Design, DSD 2015, pp.407 - 414PublisherInstitute of Electrical and Electronics Engineers Inc.
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