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Improved performance and stability of In-Sn-Zn-O thin film transistor by introducing a meso-crystalline ZrO2 high-k gate insulatorGo to Link

Choi, Wan-Ho; Sheng, Jiazhen; Jeong, Hyun-Jun; Park, Jin-Seong; Kim, MinJung; Jeon, Woojin

ArticleIssue Date2019CitationJOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, v.37, no.2, pp.1 - 10PublisherA V S AMER INST PHYSICS
SCIESCOPUS
Optimizing the Crystallinity of a ZrO2 Thin Film Insulator for InGaZnO-Based Metal–Insulator–Semiconductor CapacitorsGo to Linkopen access

Nam, Minkyeong; Lee, Seungwoo; Jeong, Hanseok; Yoon, Ara; Park, Jin-Seong; Jeon, Woojin

ArticleIssue Date2024CitationAdvanced Materials Interfaces, v.11, no.11, pp 1 - 6PublisherJohn Wiley and Sons Ltd
SCIESCOPUS
Plasma-enhanced atomic layer deposited HfO2 films using a novel heteroleptic cyclopentadienyl-based Hf precursorGo to Link

Baek, Ji-hoon; Choi, Wan-ho; Kim, Hohoon; Cheon, Seonghak; Byun, Younghun; Jeon, Woojin; Park, Jin-Seong

ArticleIssue Date2021CitationCERAMICS INTERNATIONAL, v.47, no.20, pp.29030 - 29035PublisherELSEVIER SCI LTD
SCIESCOPUS
Structurally Aligned Multifunctional Neural Probe (SAMP) Using Forest-Drawn CNT Sheet onto Thermally Drawn Polymer Fiber for Long-Term In Vivo OperationGo to Link

Jeon, Woojin; Lee, Jae Myeong; Kim, Yeji; Lee, Yunheum; Won, Joonhee; Lee, Somin; Son, Wonkyeong; Koo, Yong Hoe; Hong, Ji-Won; Gwac, Hocheol, et al.

ArticleIssue Date2024CitationAdvanced Materials, v.36, no.27, pp 1 - 13PublisherWILEY-VCH Verlag GmbH & Co. KGaA, Weinheim
SCIESCOPUS
The impact of plasma-enhanced atomic layer deposited ZrSiOx insulators on low voltage operated In-Sn-Zn-O thin film transistorsGo to Link

Kim, MinJung; Jeong, Hyun-Jun; Sheng, Jiazhen; Choi, Wan-Ho; Jeon, Woojin; Park, Jin-Seong

ArticleIssue Date2019CitationCERAMICS INTERNATIONAL, v.45, no.15, pp.19166 - 19172PublisherELSEVIER SCI LTD
SCIESCOPUS
The Significance on Structural Modulation of Buffer and Gate Insulator for ALD Based InGaZnO TFT ApplicationsGo to Link

Choi, Wan-Ho; Kim, Kyoungrok; Jeong, Seok-Goo; Han, Ju-Hwan; Jang, Jaeman; Noh, Jiyong; Park, Kwon-Shik; Kim, Jeom-Jae; Yoon, Soo-Young; Jeon, Woojin, et al.

ArticleIssue Date2021CitationIEEE Transactions on Electron Devices, v.68, no.12, pp 6147 - 6153PublisherInstitute of Electrical and Electronics Engineers
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