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Enhanced electrical stability and reliability of amorphous IGZO/HfO2 thin film transistors with CF4 plasma treatmentGo to Link

Kim, Gyulee; Kim, Sunbum; Kim, Minhyuk; Choi, Changhwan

ArticleIssue Date2025CitationApplied Surface Science, v.689, pp 1 - 9PublisherElsevier BV
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High-temperature interfacial stability of In2O3 FETs with SiO2 versus Al2O3 insulators enabling 3 nm channel scalingGo to Link

Oh, Hye-Jin; Lee, Jun-Yeoub; Beom, Jun Young; Sun, Ji Eun; Lee, Chi-Hoon; Park, Chang-Kyun; Kim, Duho; Kim, Minhyuk; Lee, Junseok; Cho, Seunghyun, et al.

ArticleIssue Date2026CitationApplied Surface Science, v.730, pp 1 - 6PublisherElsevier B.V.
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Material and Electrical Characteristics of a Thin-Film Transistor Using Cationic Composition-Controlled Atomic Layer-Deposited In–Ga–Sn–O (IGTO) Thin FilmGo to Link

Lee, Chanseul; Kim, Sunbum; Min, Kyoung Yeon; Kim, Gyulee; Kim, Minhyuk; Park, Yongjoo; Choi, Changhwan

ArticleIssue Date2026CitationACS Applied Electronic Materials, v.8, no.3, pp 1080 - 1087PublisherAmerican Chemical Society
SCIESCOPUS
The effective Work-Function of atomic layer deposited TaN thin film using TBTDET precursor and NH3 reactant gasGo to Link

Kim, Minhyuk; Choi, Moonsuk; Lee, Juhyeon; Jin, Weinan; Choi, Changhwan

ArticleIssue Date2022CitationApplied Surface Science, v.579, pp.1 - 9PublisherElsevier B.V.
SCIESCOPUS
Triphenylene-Based 2D cMOFs: Unraveling the H<sub>2</sub>S Sensing Mechanism and Applications for a Real-Time Wireless Chemiresistive SensorGo to Link

Jeon, Mingyu; Lee, Joon-Seok; Kim, Minhyuk; Seo, Jae-Woo; Kim, Honghui; Moon, Hoi Ri; Choi, Seon-Jin; Kim, Jihan

ArticleIssue Date2024CitationACS Applied Materials & Interfaces, v.16, no.45, pp 62382 - 62391PublisherAmerican Chemical Society
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