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Enhanced electrical stability and reliability of amorphous IGZO/HfO2 thin film transistors with CF4 plasma treatmentGo to Link

Kim, Gyulee; Kim, Sunbum; Kim, Minhyuk; Choi, Changhwan

ArticleIssue Date2025CitationApplied Surface Science, v.689, pp 1 - 9PublisherElsevier BV
SCIESCOPUS
Heterogeneous monolithic 3D integration for hybrid vertical CMOS inverter using n-type IGTO TFT on p-type Si FET

Lee, Chanseul; Kim, Sunbum; Kim, Gyulee; Choi, Changhwan

ArticleIssue Date2025CitationMaterials Science in Semiconductor Processing, v.185, pp 1 - 9PublisherPergamon Press
SCIESCOPUS
Material and Electrical Characteristics of a Thin-Film Transistor Using Cationic Composition-Controlled Atomic Layer-Deposited In–Ga–Sn–O (IGTO) Thin FilmGo to Link

Lee, Chanseul; Kim, Sunbum; Min, Kyoung Yeon; Kim, Gyulee; Kim, Minhyuk; Park, Yongjoo; Choi, Changhwan

ArticleIssue Date2026CitationACS Applied Electronic Materials, v.8, no.3, pp 1080 - 1087PublisherAmerican Chemical Society
SCIESCOPUS
Microstructural analysis and design of electroplated-Cu micropillar under different process variables and pattern structuresGo to Linkopen access

Park, Sangyeun; Chun, Byungkwon; Kim, Sunbum; Kim, Hak-Sung; So, Hongyun

ArticleIssue Date2025CitationMaterials & Design, v.252, pp 1 - 9PublisherElsevier BV
SCIESCOPUS
Reliability improvement of Ge2Sb2Te5-based phase-change memory devices with increased post annealing timeGo to Link

Park, San; Park, Jisu; Kim, Sunbum; Park, Junwoo; Jung, Pilseong; Ji, Sanghyun; Choi, Changhwan

ArticleIssue Date2025CitationApplied Surface Science, v.702, pp 1 - 12PublisherElsevier BV
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