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A universal re-annealing method for enhancing endurance in hafnia ferroelectric memories: Insights from stochastic noise analysis Go to Link

Koo, Ryun-Han; Shin, Wonjun; Im, Jiseong; Ryu, Sangwoo; Kim, Seungwhan; Kim, Jangsaeng; Choi, Kangwook; Park, Sung-Ho; Ko, Jonghyun; Ji, Jongho, et al.

ArticleIssue Date2025CitationChaos, Solitons & Fractals, v.199, pp 1 - 8PublisherPergamon Press Ltd.

SCIESCOPUS

Ferroelectric NAND for efficient hardware bayesian neural networks Go to Link open access

Song, Minsuk; Koo, Ryun-Han; Kim, Jangsaeng; Han, Chang-Hyeon; Yim, Jiyong; Ko, Jonghyun; Yoo, Sijung; Choe, Duk-hyun; Kim, Sangwook; Shin, Wonjun, et al.

ArticleIssue Date2025CitationNature Communications, v.16, no.1, pp 1 - 14PublisherNature Publishing Group

SCIESCOPUS

Hafnia-based ferroelectric computer vision system with artificial synaptic array Go to Link

Park, Eun Chan; Kim, Jangsaeng; Ko, Jonghyun; Shin, Wonjun; Nguyen, Manh-Cuong; Song, Minsuk; Kwon, Ki-Ryun; Koo, Ryun-Han; Kwon, Daewoong

ArticleIssue Date2025CitationNano Energy, v.139, pp 1 - 13PublisherElsevier BV

SCIESCOPUS

In Materia Shaping of Randomness with a Standard Complementary Metal-Oxide-Semiconductor Transistor for Task-Adaptive Entropy Generation Go to Link open access

Kwak, Been; Koo, Ryun-Han; Cho, Youngchan; Han, Changhyeon; Kim, Dongbin; Jeong, Soi; Shin, Yunho; Choi, Joonhyeok; Im, Jiseong; Ko, Jonghyun, et al.

ArticleIssue Date2026CitationADVANCED FUNCTIONAL MATERIALS, v.36, no.23, pp 1 - 14PublisherWILEY-V C H VERLAG GMBH

SCIESCOPUS

Interface percolation and random trap generation in ferroelectric memory: A two-step degradation mechanism explored through low-frequency noise spectroscopy Go to Link

Koo, Ryun-Han; Shin, Wonjun; Im, Jiseong; Kim, Seungwhan; Ryu, Sangwoo; Jung, Gyuweon; Kim, Jangsaeng; Park, Sung-Ho; Choi, Kangwook; Ko, Jonghyun, et al.

ArticleIssue Date2025CitationChaos, Solitons & Fractals, v.199, pp 1 - 10PublisherPergamon Press Ltd.

SCIESCOPUSKCI

Physical correlation between stochasticity and process-induced damage in ferroelectric memory devices Go to Link open access

Koo, Ryun-Han; Kim, Seungwhan; Im, Jiseong; Ryu, Sangwoo; Choi, Kangwook; Park, Sung-Ho; Ko, Jonghyun; Ji, Jongho; Oh, Mingyun; Kim, Jangsaeng, et al.

ArticleIssue Date2025CitationNano Convergence, v.12, no.1, pp 1 - 15PublisherSpringer | Korea Nano Technology Research Society

SCIESCOPUS

Polarization Pruning: Reliability Enhancement of Hafnia-Based Ferroelectric Devices for Memory and Neuromorphic Computing Go to Link open access

Koo, Ryun-Han; Shin, Wonjun; Kim, Jangsaeng; Yim, Jiyong; Ko, Jonghyun; Jung, Gyuweon; Im, Jiseong; Park, Sung-Ho; Kim, Jae-Joon; Cheema, Suraj S, et al.

ArticleIssue Date2024CitationAdvanced Science, v.11, no.43, pp 1 - 13PublisherWiley-VCH Verlag

SCIESCOPUS

Strain-Stress Impact on Ferroelectric Devices: A Multilayer Analysis and Optimization Strategy for Neural Networks

Koo, Ryun-Han; Shin, Wonjun; Jung, Gyuweon; Kim, Jangsaeng; Lee, Sung-Tae; Im, Jiseong; Park, Sung-Ho; Ko, Jonghyun; Kwon, Daewoong; Lee, Jong-Ho

ArticleIssue Date2024CitationACS Materials Letters, v.6, no.11, pp 5170 - 5178PublisherAMER CHEMICAL SOC

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Browsing by Ko, JonghyunAuthor

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