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Challenging issues for terra-bit-level perpendicular STT-MRAM

Park, JG; Shim, TH; Chae, KS; Lee, DY; Takemura, Y; Lee, SE; Jeon, MS; Baek, JU; Park, SO; Hong, Jin Pyo

ArticleIssue Date2015CitationTechnical Digest - International Electron Devices Meeting, v.2015-February, no.February, pp 19.2.1 - 19.2.4
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