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Challenging issues for terra-bit-level perpendicular STT-MRAM

Authors
Park, JGShim, THChae, KSLee, DYTakemura, YLee, SEJeon, MSBaek, JUPark, SOHong, Jin Pyo
Issue Date
Feb-2015
Citation
Technical Digest - International Electron Devices Meeting, v.2015-February, no.February, pp 19.2.1 - 19.2.4
Indexed
SCOPUS
Journal Title
Technical Digest - International Electron Devices Meeting
Volume
2015-February
Number
February
Start Page
19.2.1
End Page
19.2.4
URI
https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/143244
DOI
10.1109/IEDM.2014.7047081
ISSN
0163-1918
Abstract
The current challenging issues for terra-bit-level perpendicular STT-MRAM cells have been reviewed in the view of four critical parameters such as TMR ratio, Δ, Jex, and α. The TMR ratio of p-MTJ spin-valves are reaching to < 150% at the BEOL of >350°C. A single MgO based p-MTJ spin-valve could not satisfy Δ of > 74, proposing a double MgO based p-MTJ spin-valve. Jex in SyAF layer adequately met > 0.7erg/cm2 at BEOL of > 350°C. A Co2Fe6B2 based p-MTJ spin-valve limits to a of 0.005, necessary to develop a low α material such as full Heusler half-metal. Thus, an essential challenge in the future is to satisfy four critical parameters simultaneously at > 350°C and 300-mm TiN electrode wafers.
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