Challenging issues for terra-bit-level perpendicular STT-MRAM
- Authors
- Park, JG; Shim, TH; Chae, KS; Lee, DY; Takemura, Y; Lee, SE; Jeon, MS; Baek, JU; Park, SO; Hong, Jin Pyo
- Issue Date
- Feb-2015
- Citation
- Technical Digest - International Electron Devices Meeting, v.2015-February, no.February, pp 19.2.1 - 19.2.4
- Indexed
- SCOPUS
- Journal Title
- Technical Digest - International Electron Devices Meeting
- Volume
- 2015-February
- Number
- February
- Start Page
- 19.2.1
- End Page
- 19.2.4
- URI
- https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/143244
- DOI
- 10.1109/IEDM.2014.7047081
- ISSN
- 0163-1918
- Abstract
- The current challenging issues for terra-bit-level perpendicular STT-MRAM cells have been reviewed in the view of four critical parameters such as TMR ratio, Δ, Jex, and α. The TMR ratio of p-MTJ spin-valves are reaching to < 150% at the BEOL of >350°C. A single MgO based p-MTJ spin-valve could not satisfy Δ of > 74, proposing a double MgO based p-MTJ spin-valve. Jex in SyAF layer adequately met > 0.7erg/cm2 at BEOL of > 350°C. A Co2Fe6B2 based p-MTJ spin-valve limits to a of 0.005, necessary to develop a low α material such as full Heusler half-metal. Thus, an essential challenge in the future is to satisfy four critical parameters simultaneously at > 350°C and 300-mm TiN electrode wafers.
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Collections - 서울 자연과학대학 > 서울 물리학과 > 1. Journal Articles

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