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High Field-Effect Mobility Two-Channel InGaZnO Thin-Film Transistors for Low-Voltage OperationGo to Link

Yun, Kwang-Ro; Lee, Hwa-Seub; Kim, Jong-Ho; Lee, Tae-Ju; Park, Jin-Seong; Seong, Tae-Yeon

ArticleIssue Date2021CitationIEEE Transactions on Electron Devices, v.68, no.12, pp 6166 - 6170PublisherInstitute of Electrical and Electronics Engineers
SCOPUS
Reliability Analysis of Three-Phase Transformer-less UPS using SiC devicesGo to Link

Lee, Tae-Ju; Lee, Dong-Ju; Kim, Rae-Young

ArticleIssue Date2024Citation2024 27TH INTERNATIONAL CONFERENCE ON ELECTRICAL MACHINES AND SYSTEMS, ICEMS, pp 2550 - 2555PublisherIEEE
SCOPUS
Reliability Assessment and Optimal Scheduling Strategy of Battery Energy Storage SystemsGo to Link

Lee, Tae-Ju; Lee, Dong-Ju; Kim, Rae-Young

ArticleIssue Date2026Citation2025 28th International Conference on Electrical Machines and Systems (ICEMS), pp 3375 - 3380PublisherInstitute of Electrical and Electronics Engineers Inc.
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