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SCIESCOPUS

A facile acid induced water-based solvent by improving hydrophobicity for simultaneous remediating total petroleum hydrocarbon, heavy metals and benzo(a) pyrene contaminated soil: Laboratory- and pilot-scale studies Go to Link

Choong, Choe Earn; Wong, Kien Tiek; Yoon, So Yeon; Kim, Heeyeon; Shin, Mincheol; Chang, Yoon-Young; Yang, Jae-kyu; Kim, Sang-Hyoun; Jeon, Byong Hun; Yoon, Yeomin, et al.

ArticleIssue Date2021CitationJOURNAL OF CLEANER PRODUCTION, v.278, pp.1 - 11PublisherELSEVIER SCI LTD

SCOPUS

Design Methodology for Low-Voltage Operational (≤1 V) FRAM Cell Capacitors and Approaches for Overcoming Disturb Issues in 1T-nC Arrays: Experimental & Modeling Go to Link

Lee, Sangho; Kim, Giuk; Kim, Chaeheon; Jung, Yangjin; Hwang, Jeonghyun; Nam, Yunseok; Shin, Mincheol; Goh, Youngin; Ryu, Mintae; Suh, Jihye, et al.

ArticleIssue Date2025CitationTechnical Digest - International Electron Devices Meeting, pp 1 - 4

SCISCIESCOPUS

Effects of suboxide layers on the electronic properties of Si(100)/SiO2 interfaces: Atomistic multi-scale approach Go to Link

Kim, Byung-Hyun; Kim, Gyubong; Park, Kihoon; Shin, Mincheol; Chung, Yong-Chae; Lee, Kwang-Ryeol

ArticleIssue Date2013CitationJournal of Applied Physics, v.113, no.7, pp 1 - 7PublisherAmerican Institute of Physics

SCIESCOPUS

Engineering Negative Capacitance in Hf0.5Zr0.5O2 for Low-Power and Reliable Charge Trap Flash Memory Go to Link

Nam, Yunseok; Lee, Sangho; Jung, Yangjin; Kim, Kang; Ok, Jihye; Ha, Jinwook; Yoon, Heemin; Shin, Mincheol; Park, Sang-Hee Ko; Ahn, Jinho, et al.

ArticleIssue Date2026CitationACS APPLIED MATERIALS & INTERFACES, v.18, no.1, pp 3065 - 3073PublisherAMER CHEMICAL SOC

SCIESCOPUS

Middle Interlayer Engineered Ferroelectric NAND Flash Overcoming Reliability and Stability Bottlenecks for Next-Generation High-Density Storage Systems Go to Link open access

Kim, Giuk; Lee, Sangho; Choi, Hyojun; Jung, Yangjin; Kim, Woongjin; Park, Sanghyun; Seo, Kwangyou; Kim, Kwangsoo; Kim, Wanki; Ha, Daewon, et al.

ArticleIssue Date2025CitationADVANCED SCIENCE, v.12, no.40, pp 1 - 16PublisherWILEY

SCIESCOPUS

Stabilized negative capacitance for near-theoretical efficiency and high reliability in charge trap flash memory Go to Link

Lee, Sangho; Kim, Giuk; Nam, Yunseok; Jeong, Yangjin; Kang, Hyunjun; Kim, Woongjin; Shin, Hunbeom; Shin, Mincheol; Park, Sanghyun; Seo, Kwangyou, et al.

ArticleIssue Date2025CitationMaterials Today Physics, v.58, pp 1 - 10PublisherELSEVIER SCIENCE BV

SCOPUS

Unveiling the Origin of Disturbance in FeFET and the Potential of Multifunctional TiO2 as a Breakthrough for Disturb-free 3D NAND Cell: Experimental and Modeling Go to Link

Kim, Giuk; Kang, Hyunjun; Lee, Sangho; Choi, Hyojun; Jung, Yangjin; Shin, Mincheol; Kim, Kwangsoo; Lim, Suhwan; Woo, Jongho; Kim, Wanki, et al.

ArticleIssue Date2025CitationTechnical Digest - International Electron Devices Meeting, pp 1 - 4

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Browsing by Shin, MincheolAuthor

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