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Degradation and Recovery in HZO-Based FeFETs under Hydrogen and Thermal Stress for CMOS IntegrationGo to Link

Han, Changhyeon; Kwak, Been; Yoo, Yelin; Kwak, Sangeun; Kwon, Daewoong

ArticleIssue Date2026CitationACS Applied Electronic Materials, v.8, no.3, pp 1173 - 1180PublisherAmerican Chemical Society
SCOPUS
First demonstration of federated learning with homomorphic encryption using vertically-stacked ferroelectric tunnel junctionGo to Link

Kim, Jeong-Han; Im, Jiseong; Song, Minsuk; Yoo, Yelin; Lee, Jongwoo; Koo, Ryun-Han; Kim, Jangsaeng; Kwon, Daewoong

ArticleIssue Date2026Citation2025 IEEE International Electron Devices Meeting (IEDM), pp 1 - 4PublisherIEEE
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